Run:360075 Event:169 --  Total yield error: IC/CT05 = 0.93 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:173 --  Total yield error: Si/CT05 = 32.99 nC/10^12ppp : Si = 25.3 nC
Run:360075 Event:174 --  Total yield error: Si/CT05 = 31.41 nC/10^12ppp : Si = 22.8 nC
Run:360075 Event:174 --  Total yield error: IC/CT05 = 0.89 nC/10^12ppp : IC = 0.6 nC
Run:360075 Event:175 --  Total yield error: Si/CT05 = 30.23 nC/10^12ppp : Si = 22.9 nC
Run:360075 Event:175 --  Total yield error: IC/CT05 = 0.86 nC/10^12ppp : IC = 0.6 nC
Run:360075 Event:176 --  Total yield error: Si/CT05 = 30.14 nC/10^12ppp : Si = 22.9 nC
Run:360075 Event:176 --  Total yield error: IC/CT05 = 0.89 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:177 --  Total yield error: Si/CT05 = 30.99 nC/10^12ppp : Si = 22.0 nC
Run:360075 Event:177 --  Total yield error: IC/CT05 = 0.88 nC/10^12ppp : IC = 0.6 nC
Run:360075 Event:181 --  Total yield error: Si/CT05 = 31.70 nC/10^12ppp : Si = 24.3 nC
Run:360075 Event:181 --  Total yield error: IC/CT05 = 0.90 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:182 --  Total yield error: Si/CT05 = 32.31 nC/10^12ppp : Si = 24.1 nC
Run:360075 Event:182 --  Total yield error: IC/CT05 = 0.92 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:183 --  Total yield error: Si/CT05 = 32.35 nC/10^12ppp : Si = 24.4 nC
Run:360075 Event:183 --  Total yield error: IC/CT05 = 0.93 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:184 --  Total yield error: Si/CT05 = 32.00 nC/10^12ppp : Si = 23.7 nC
Run:360075 Event:184 --  Total yield error: IC/CT05 = 0.91 nC/10^12ppp : IC = 0.7 nC
Run:360075 Event:186 --  Total yield error: Si/CT05 = 19.07 nC/10^12ppp : Si = 14.3 nC
Run:360075 Event:186 --  Total yield error: IC/CT05 = 0.57 nC/10^12ppp : IC = 0.4 nC
Run:360075 Event:187 --  Total yield error: Si/CT05 = 21.77 nC/10^12ppp : Si = 16.9 nC
Run:360075 Event:187 --  Total yield error: IC/CT05 = 0.64 nC/10^12ppp : IC = 0.5 nC
Run:360075 Event:188 --  Total yield error: Si/CT05 = 20.73 nC/10^12ppp : Si = 15.8 nC
Run:360075 Event:188 --  Total yield error: IC/CT05 = 0.57 nC/10^12ppp : IC = 0.4 nC
Run:360075 Event:189 --  Total yield error: Si/CT05 = 21.78 nC/10^12ppp : Si = 15.8 nC
Run:360075 Event:189 --  Total yield error: IC/CT05 = 0.64 nC/10^12ppp : IC = 0.5 nC
Run:360075 Event:190 --  Total yield error: Si/CT05 = 21.94 nC/10^12ppp : Si = 16.8 nC
Run:360075 Event:190 --  Total yield error: IC/CT05 = 0.62 nC/10^12ppp : IC = 0.5 nC
Run:360075 Event:191 --  Total yield error: Si/CT05 = 21.95 nC/10^12ppp : Si = 16.9 nC
Run:360075 Event:191 --  Total yield error: IC/CT05 = 0.63 nC/10^12ppp : IC = 0.5 nC
Run:360075 Event:192 --  Total yield error: Si/CT05 = 23.01 nC/10^12ppp : Si = 16.8 nC
Run:360075 Event:192 --  Total yield error: IC/CT05 = 0.66 nC/10^12ppp : IC = 0.5 nC