Run:360061 Event:12 --  Total yield error: Si/CT05 = 9.13 nC/10^12ppp : Si = 446.2 nC
Run:360061 Event:12 --  Total yield error: IC/CT05 = 0.26 nC/10^12ppp : IC = 12.9 nC
Run:360061 Event:13 --  Total yield error: Si/CT05 = 9.11 nC/10^12ppp : Si = 446.3 nC
Run:360061 Event:13 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 13.0 nC
Run:360061 Event:14 --  Total yield error: Si/CT05 = 9.18 nC/10^12ppp : Si = 445.6 nC
Run:360061 Event:14 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 12.9 nC
Run:360061 Event:15 --  Total yield error: Si/CT05 = 9.17 nC/10^12ppp : Si = 446.7 nC
Run:360061 Event:15 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 13.0 nC
Run:360061 Event:16 --  Total yield error: Si/CT05 = 9.10 nC/10^12ppp : Si = 445.7 nC
Run:360061 Event:16 --  Total yield error: IC/CT05 = 0.26 nC/10^12ppp : IC = 12.9 nC
Run:360061 Event:17 --  Total yield error: Si/CT05 = 9.20 nC/10^12ppp : Si = 445.5 nC
Run:360061 Event:17 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 12.9 nC
Run:360061 Event:18 --  Total yield error: Si/CT05 = 9.13 nC/10^12ppp : Si = 446.2 nC
Run:360061 Event:18 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 13.0 nC
Run:360061 Event:19 --  Total yield error: Si/CT05 = 9.19 nC/10^12ppp : Si = 447.3 nC
Run:360061 Event:19 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 12.9 nC
Run:360061 Event:20 --  Total yield error: Si/CT05 = 9.23 nC/10^12ppp : Si = 448.2 nC
Run:360061 Event:20 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 13.0 nC
Run:360061 Event:21 --  Total yield error: Si/CT05 = 9.19 nC/10^12ppp : Si = 446.8 nC
Run:360061 Event:21 --  Total yield error: IC/CT05 = 0.27 nC/10^12ppp : IC = 13.1 nC